Test Circuit for a High-Power Semiconductor Element

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This invention relates to a test circuit designed for high-power semiconductor elements, such as thyristors, used in HVDC (High Voltage Direct Current) power transmission systems. The circuit incorporates multiple voltage-controlled converter modules arranged in series to form a highly flexible high-voltage source. This setup allows independent and non-mains-frequency-dependent adjustment of the test conditions for these semiconductor devices, enabling accurate and adaptable simulation of real operational conditions without requiring large, cumbersome back-to-back test setups or adaptation for different line frequencies.

Use CasesContent extracted from patent full text and abstract with AI.

• Testing high-power semiconductor elements (e.g., thyristors, IGBTs) before deployment in HVDC power transmission systems.
• Laboratory simulation of operational conditions for power converter components used in grid infrastructure.
• Quality assurance and certification of semiconductor switches for static var compensators (SVC) and large power converters.
• Development and validation of new semiconductor devices for next-generation power transmission.
• Academic research into the performance of power converter devices under varied voltage and current profiles.

BenefitsContent extracted from patent full text and abstract with AI.

• Highly flexible and precise simulation of complex voltage and current profiles for testing semiconductor devices.
• Independent of mains (grid) frequency, enabling the same test system for 50 Hz and 60 Hz applications.
• Reduces the size, complexity, and cost of test installations compared to traditional back-to-back test setups.
• Easily accommodates specification changes or different test standards without hardware modifications.
• Allows fine-grained control and programmability of test voltages, currents, and operational profiles, supporting complete test compliance with international standards (IEC, IEEE).
• Minimizes energy consumption and impact on the utility grid by locally storing and releasing test energy in module capacitors.

Technical Classifications (CPCs)

Inventors & Applicants

Patent Abstract

The invention relates to a test circuit (20) for a high-power semiconductor element (11) in power converters for high-voltage direct-current power transmission, said circuit comprising: a high-voltage circuit (22) with a terminal (31) for the high-power semiconductor element (11); and a high-voltage source (28) that can be connected to the high-power semiconductor element (11). The test circuit is intended to allow a particularly flexible setting of test conditions and to function in particular independently of the mains frequency. To achieve this, the high-voltage source (28) comprises a plurality of voltage-controlled power converter modules (16) connected in a first series (29).