Electron Source for Generating an Electron Beam

Publication: WO2021037481A1
Published: 2021-03-04
Family Size: 6
Granted: Yes (1/6)

Simple SummaryContent extracted from patent full text and abstract with AI.

This invention describes a novel electron source capable of generating a focused, high-energy electron beam. The key innovation lies in using a graphene layer as anode and/or cathode, epitaxially grown on a silicon carbide substrate, enabling all main components (cathode, anode, focusing elements) to be fabricated monolithically on a single silicon carbide chip. This approach allows for highly miniaturized, integrated on-chip electron sources, suitable even as compact X-ray sources.

Use CasesContent extracted from patent full text and abstract with AI.

  • On-chip X-ray emission sources for medical imaging or diagnostics
  • Miniaturized electron sources for electron microscopy (e.g., scanning electron microscopes, SEMs)
  • Integrated electron beam lithography in semiconductor manufacturing
  • Portable/handheld X-ray devices for material analysis or security screening
  • Compact particle accelerators for research or medical therapies
  • On-chip synchrotron radiation sources for laboratory-scale experiments

BenefitsContent extracted from patent full text and abstract with AI.

  • Enables significant miniaturization and integration, reducing the size, complexity, and cost of electron and X-ray sources.
  • Monolithic chip fabrication improves reliability, robustness, and manufacturing scalability.
  • High emission stability, long operational lifetime, and potentially lower maintenance compared to traditional thermionic or field emission sources.
  • Compatible with conventional silicon carbide processing, making it industrially feasible for wafer-scale production.
  • Graphene's exceptional robustness allows for high current density and stable operation under demanding conditions.
  • Improved integration with other electronic, mechanical, or mechatronic systems on a single chip.
  • Allows development of portable and novel diagnostic or analytical instrumentation.

Technical Classifications (CPCs)

Main Classifications

Electrical & Electronic Tech

Sub Classifications

Electric Elements

CPC Codes

H01J1/3046H01J1/316H01J3/021H01J3/027H01J35/02H01J35/064H01J35/065H01J35/066

Inventors & Applicants

Applicants

Univ Friedrich Alexander Er

Patent Abstract

The invention relates to an electron source (2) for generating an electron beam (8), comprising a cathode (1) and an anode (4) in the form of a graphene layer (6, 12) which is epitaxially grown with a silicon carbide substrate (5). The invention is suitable for the monolithic production of a miniaturized source of a focused high-energy electron beam, including for the use thereof as an on-chip X-ray source. All components can be produced from or on a single silicon carbide chip.

Key Information

Publication No.

WO2021037481A1

Family ID

71950613

Publication Date

2021-03-04

Application No.

EP2020071704W

Application Date

2020-07-31

Priority Date

2019-08-29

Granted

Yes (1/6)

Possible Cooperation

For further information please contact the transfer office.