Electron Source for Generating an Electron Beam
Simple SummaryContent extracted from patent full text and abstract with AI.
This invention describes a novel electron source capable of generating a focused, high-energy electron beam. The key innovation lies in using a graphene layer as anode and/or cathode, epitaxially grown on a silicon carbide substrate, enabling all main components (cathode, anode, focusing elements) to be fabricated monolithically on a single silicon carbide chip. This approach allows for highly miniaturized, integrated on-chip electron sources, suitable even as compact X-ray sources.
Use CasesContent extracted from patent full text and abstract with AI.
- On-chip X-ray emission sources for medical imaging or diagnostics
- Miniaturized electron sources for electron microscopy (e.g., scanning electron microscopes, SEMs)
- Integrated electron beam lithography in semiconductor manufacturing
- Portable/handheld X-ray devices for material analysis or security screening
- Compact particle accelerators for research or medical therapies
- On-chip synchrotron radiation sources for laboratory-scale experiments
BenefitsContent extracted from patent full text and abstract with AI.
- Enables significant miniaturization and integration, reducing the size, complexity, and cost of electron and X-ray sources.
- Monolithic chip fabrication improves reliability, robustness, and manufacturing scalability.
- High emission stability, long operational lifetime, and potentially lower maintenance compared to traditional thermionic or field emission sources.
- Compatible with conventional silicon carbide processing, making it industrially feasible for wafer-scale production.
- Graphene's exceptional robustness allows for high current density and stable operation under demanding conditions.
- Improved integration with other electronic, mechanical, or mechatronic systems on a single chip.
- Allows development of portable and novel diagnostic or analytical instrumentation.
Technical Classifications (CPCs)
Main Classifications
Electrical & Electronic Tech
Sub Classifications
Electric Elements
CPC Codes
Inventors & Applicants
Applicants
Univ Friedrich Alexander Er
Patent Abstract
The invention relates to an electron source (2) for generating an electron beam (8), comprising a cathode (1) and an anode (4) in the form of a graphene layer (6, 12) which is epitaxially grown with a silicon carbide substrate (5). The invention is suitable for the monolithic production of a miniaturized source of a focused high-energy electron beam, including for the use thereof as an on-chip X-ray source. All components can be produced from or on a single silicon carbide chip.
Key Information
Publication No.
WO2021037481A1
Family ID
71950613
Publication Date
2021-03-04
Application No.
EP2020071704W
Application Date
2020-07-31
Priority Date
2019-08-29
Granted
Yes (1/6)
Possible Cooperation
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