Structured Scatter Grid
Simple SummaryContent extracted from patent full text and abstract with AI.
This patent describes a method for producing a structured anti-scatter grid using a cathode sputtering process. The process creates a substructure with vertical voids in the walls of the anti-scatter grid. The invention also covers the anti-scatter grid itself, as well as its application in X-ray detectors and computed tomography (CT) systems.
Use CasesContent extracted from patent full text and abstract with AI.
- X-ray imaging systems in hospitals or clinics
- Computed tomography (CT) scanners
- Advanced digital radiography equipment
- Industrial non-destructive testing using X-ray imaging
BenefitsContent extracted from patent full text and abstract with AI.
- Improved image quality by minimizing scatter radiation in X-ray and CT imaging
- Enhanced precision and reliability in medical diagnostics
- Potential for reduced patient exposure to X-ray radiation
- Greater durability and performance in imaging hardware due to improved grid structure
Technical Classifications (CPCs)
Main Classifications
Chemistry & Materials Science
Physics & Measurement
Sub Classifications
Coating Metallic Material
Measuring & Testing
Nuclear Physics & Engineering
CPC Codes
Inventors & Applicants
Applicants
Univ Friedrich Alexander Er
Siemens Healthcare Gmbh
Patent Abstract
Es wird ein Streustrahlenraster-Erzeugungsverfahren beschrieben. Im Rahmen des Streustrahlenraster-Erzeugungsverfahrens wird ein Kathodenzerstäubungsverfahren zur Erzeugung eines Streustrahlenrasters (1) angewendet. Dabei wird mit dem Kathodenzerstäubungsverfahren eine Substruktur (3) mit vertikalen Aussparungen in den Wänden (2) des Streustrahlenrasters (1) erzeugt. Es wird auch ein Streustrahlenraster (1) beschrieben. Überdies wird ein Röntgendetektor (66) beschrieben. Weiterhin wird ein Computertomographiesystem (50) beschrieben.
Key Information
Publication No.
DE102019200244B3
Family ID
70859554
Publication Date
2020-06-18
Application No.
DE102019200244A
Application Date
2019-01-10
Priority Date
2019-01-10
Granted
Yes (1/1)
Possible Cooperation
For further information please contact the transfer office.