System and Method for Calibration of a Network Analyzer and for Characterization of a Measurement Fixture

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This patent describes a method and system for the calibration of network analyzers and the characterization of measuring fixtures using a sophisticated 16-term error model. By employing a set of calibration standards and applying mathematical techniques, the method enables precise determination and correction of systematic measurement errors, including signal transmission, reflection, and crosstalk effects. This advances the accuracy of high-frequency measurements, especially in complex test setups.

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• Accurate calibration of vector network analyzers in radio frequency (RF) and microwave laboratories.
• Characterization and error correction in measurement fixtures for semiconductor wafer testing or circuit board evaluation.
• Improved measurement of scattering parameters (S-parameters) for electronic components, enabling precise device modeling.
• High-precision manufacturing testing and validation of communication hardware (e.g., antennas, filters, amplifiers).
• Use in research or production environments requiring highly accurate high-frequency electrical measurements.

BenefitsContent extracted from patent full text and abstract with AI.

• Significantly enhances measurement accuracy by compensating for systematic errors, including crosstalk and fixture effects.
• Reduces dependence on having perfectly known calibration standards, providing more flexible and robust calibration procedures.
• Supports complex test setups involving multi-port devices and measurement fixtures, improving versatility.
• Enables comprehensive error analysis and correction through mathematical modeling, contributing to reliable and repeatable measurement results.
• Facilitates high-frequency and microwave measurements necessary for cutting-edge communication and electronic device development.

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Patent Abstract

The invention relates to a method and a system for calibrating a measuring arrangement using a 16-term error model. A matrix (A) is ascertained using measured scattering parameters (S m ) of different calibration standards (3) and using corresponding actual scattering parameters (S a ) of the calibration standards (3), and linear-in-T system errors (T̃ i ) are determined in order to calibrate the network analyzer (1) by solving a system of linear equations comprising the ascertained matrix (A). A first and a second linear-in-T system error (k, p) are each freely selected in order to solve the system of linear equations. When using reciprocal calibration standards, the specified linear-in-T system errors are weighted with the freely selected first linear-in-T system error (T̃ i ) or with a correct second linear-in-T system error (p kor (k)) which is dependent on the first linear-in-T system error (k).