Device, Method and Computer Program for Non-Destructive Material Testing of Solar Modules

Publication: DE102019209000A1
Published: 2020-12-24
Family Size: 1
Granted: No

Simple SummaryContent extracted from patent full text and abstract with AI.

This invention is a device, method, and computer program for non-destructive material testing of solar modules. The system captures multiple electroluminescence images of a solar module or component surface and uses these to generate a super-resolution image. This high-quality image is then used to assess and diagnose the condition of the solar module.

Use CasesContent extracted from patent full text and abstract with AI.

  • Quality control in solar module manufacturing lines
  • Routine maintenance inspection of installed solar panels in solar farms
  • Research and development testing of new solar materials or technologies
  • Detecting micro-cracks or defects in solar cells without damaging them
  • Automated inspection systems for photovoltaic cell production

BenefitsContent extracted from patent full text and abstract with AI.

  • Non-destructive testing preserves the integrity of solar modules under inspection
  • Super-resolution imaging provides more detailed and accurate diagnostics
  • Improved detection of small defects or degradation in solar cells
  • Enables automated and efficient large-scale quality control
  • Supports higher reliability and longevity of solar power systems

Technical Classifications (CPCs)

Main Classifications

Electrical & Electronic Tech

Physics & Measurement

Sub Classifications

Computing & Calculating

Electric Power Generation & Distribution

Measuring & Testing

CPC Codes

G01N21/66G01N21/956G06T3/4053G06T7/0004H02S50/10

Inventors & Applicants

Applicants

Univ Friedrich Alexander Er

Patent Abstract

Vorrichtung zum zerstörungsfreien Werkstoffprüfen von Solarmodulen oder einer Oberfläche einer Komponente. Die Vorrichtung ist dazu ausgebildet, eine Mehrzahl von Elektrolumineszenzbildern eines zu prüfenden Solarmoduls oder einer Oberfläche einer zu prüfenden Komponente zu erhalten. Darüber hinaus ist die Vorrichtung dazu ausgebildet, ein Superauflösungsbild auf der Basis der Elektrolumineszenzbilder zu erhalten und ein Testergebnis auf der Basis des Superauflösungsbilds zu erhalten.

Key Information

Publication No.

DE102019209000A1

Family ID

73654311

Publication Date

2020-12-24

Application No.

DE102019209000A

Application Date

2019-06-19

Priority Date

2019-06-19

Granted

No

Possible Cooperation

For further information please contact the transfer office.