Method for Testing Components and Measuring Arrangement

Simple SummaryContent extracted from patent full text and abstract with AI.

This invention describes a method and system for efficiently testing multiple electronic components. It works by grouping the components in different ways, measuring specific electrical properties of each group, and analyzing these measurements to determine which individual components meet certain predefined criteria.

Use CasesContent extracted from patent full text and abstract with AI.

• Quality control testing of semiconductor chips in manufacturing lines
• Automated screening of electronic parts in assembly plants
• Fault diagnosis in large arrays of sensors or circuits
• Batch characterization of discrete electronic components before product integration
• Testing for faulty units in modular hardware systems

BenefitsContent extracted from patent full text and abstract with AI.

• Enables faster testing of multiple components simultaneously, increasing throughput
• Reduces resource usage compared to testing each component individually
• Improves the reliability and accuracy of detecting defective components
• Facilitates scalable and automated quality control processes
• Can be adapted to various electronic devices and component types

Technical Classifications (CPCs)

Inventors & Applicants

Patent Abstract

Method for testing devices and measuring device are provided. The method for testing a plurality of electronic components is provided, including subdividing the plurality of electronic components into a plurality of first groups and subdividing the plurality of electronic components into a plurality of second groups. The method may further include measuring, for each first group, an electrical parameter of an interconnection of the components of the first group; measuring, for each second group, an electrical parameter of an interconnection of the components of the second group, and determining which electronic components of the plurality of electronic components have a predefined property, on the basis of the result of the measurement of the electrical parameter for the first groups and on the basis of the result of the measurement of the electrical parameter for the second groups.